Silicon Standard For ICP/MS, SPEX CertiPrep™

Description

Includes

NIST Traceable Certificate of Analysis accredited to ISO/IEC 17025 and ISO/IEC Guide 34, Safety Data Sheet

ISO/IEC Guide 34 Certified, NIST-Traceable Certified Reference Material

Inorganic Standard manufactured for AA, ICP, ICP/MS, IC, XRF, and other analytical instrumentation

Analyte	Concentration
Si	1μg/mL

Certifications

Accredited by A2LA for ISO/IEC 17025 and ISO/IEC Guide 34 and certified by UL-DQS to ISO 9001

Compliance

GHS/OSHA Complaint

Specifications

• CAS: 7440-21-3
• Molecular Formula: Si
• MDL Number: MFCD00085311
• InChI Key: XUIMIQQOPSSXEZ-UHFFFAOYSA-N
• SMILES: [Si]
• IUPAC Name: silicon
• Molecular Weight (g/mol): 28.09
• PubChem CID: 5461123
• ChEBI: CHEBI:27573
• Concentration or Composition (by Analyte or Components): 1mg/L
• Packaging: Triple-leached LDPE bottle
• Solvent or Matrix: H₂O/Tr. F-
• Quantity: 125 mL
• For Use With (Equipment): AA, ICP, ICP/MS, IC, XRF, and Other Analytical Instrumentation
• Concentration or Composition Notes: Up to 68 elements are scanned with found values for ICP and ICP-MS standards. The found value of the trace metallic impurities is reported on the Certificate of Analysis.
• Chemical Name or Material: Silicon Standard

Product intended for laboratory use only